PI - Nanopositioning Piezo Flexure Stages / Nanometer Precision: Piezo Stages for Nanopositioning Applications

What are Nanopositioning Piezo Flexure Stages? What is Nano Positioning?

A positioning tool with nanoscale or sub-nanometer resolution is referred to as a "nanopositioning stage." Although there are many different kinds of nanopositioners, those that are piezo-driven, flexure-guided, and have direct metrology position feedback, such capacitive sensors, exhibit the best dynamics and precision.

What are the advantages of using Nanopositioning Piezo Flexure Stages?

With minimal crosstalk, PI's piezo flexure stages combine sub-nanometer resolution, guiding precision, and both. Because of this, they are especially well suited for applications in metrology, super resolution microscopy, interferometry, or inspection systems for the manufacturing of semiconductor chips. Piezo flexure stages are offered for dynamic scanning with up to several hundred Hertz in up to six degrees of freedom and millisecond-settling precision placement.

In applications where nanoscale precision, high scanning rates, or quick step and settle are essential for success, nanopositioners like piezo stages are used. The best mechanisms for nanopositioning applications continue to be flexure guided nanopositioners with piezo motors.

Excellent and resilient mechanics are produced by the special mix of patented sensor design, frictionless flexure guides, and long-life PICMA® piezo actuators. Piezo motion controllers enable the optimization of positioning and scanning performance and are simple to integrate using digital or analog interfaces with straightforward programming.

Nano Positioning, Example Application Areas,

Fiber positioning and alignment, Scanning microscopy, 2-photon polymerization, Nanotechnology and nanomanufacturing, Photonics / integrated optics, Micromanipulation, Sample positioning , Mask/wafer positioning, Nanopositioning with high flatness and straightness of motion, Lithography, Super-resolution microscopy , Metrology, Interferometry Super-resolution microscopy , Metrology, Interferometry